• DocumentCode
    2963001
  • Title

    Influence of Refresh Circuits Connected to Low Power Digital Quasi-Floating Gate Designs

  • Author

    Alfredsson, Jon ; Oelmann, Bengt

  • Author_Institution
    Mid Sweden Univ., Sundsvall
  • fYear
    2006
  • fDate
    10-13 Dec. 2006
  • Firstpage
    1296
  • Lastpage
    1299
  • Abstract
    For digital circuits with ultra-low power consumption, floating-gate circuits (FGMOS) have been considered to be a potentially better technique than standard static CMOS circuits. For each new generation of process technology the thickness of the transistor gate-oxide will be reduced. This will increase charge leakage in FGMOS circuits and it is therefore necessary to introduce techniques to keep the charge in the node. In this paper we investigate how the most commonly used refresh circuits (quasi-and pseudo-floating gate) affect the performance when they are connected to an FGMOS circuit working with subthreshold power supply. The simulations show that refresh circuits equal in size compared to FGMOS will not have much influence on performance while it is reduced up to an order in magnitude when the size increase 8 times. This strong impact from the refresh circuitry also indicates that it might not be an option for future technologies.
  • Keywords
    MOS integrated circuits; digital integrated circuits; leakage currents; low-power electronics; FGMOS circuits; charge leakage; digital circuits; floating-gate circuits; low power digital quasifloating gate designs; quasi-and pseudo-floating gate; refresh circuits; transistor gate-oxide; ultra-low power consumption; CMOS process; Capacitance; Circuit simulation; Digital circuits; Energy consumption; Information technology; MOSFETs; Manufacturing; Power supplies; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 2006. ICECS '06. 13th IEEE International Conference on
  • Conference_Location
    Nice
  • Print_ISBN
    1-4244-0395-2
  • Electronic_ISBN
    1-4244-0395-2
  • Type

    conf

  • DOI
    10.1109/ICECS.2006.379719
  • Filename
    4263612