Title :
Polymer diffusants in III-V semiconductor compounds technology
Author :
Kamanin, A.V. ; Mokina, I.A. ; Shmidt, N.M. ; Busygina, L.A. ; Yurre, T.A.
Author_Institution :
A.F. Ioffe Physicotech. Inst., Acad. of Sci., St. Petersburg, Russia
Abstract :
A Zn diffusion technique into III-V compounds from polymer spin-on films has been devised that allows to retain the initial surface morphology without any additional operations. This essentially simplifies the process. Moreover, the method provides a high portion (about 100%) of the electrically active Zn at NZn<L(Zn). The technique shows promise for applying in the technology of III-V compound devices. The possibilities for the local diffusion through the windows of the SiO2 mask with retention of dielectric properties of the mask is pointed out. During the Zn diffusion into Al xGa1-xAs gettering of the Al atoms was observed that allowed to obtain the high Zn atoms concentration at their near-total activation. This process resulted in homogenization of the near-surface regions
Keywords :
III-V semiconductors; aluminium compounds; diffusion; gallium arsenide; getters; polymer films; semiconductor doping; surface structure; zinc; AlxGa1-xAs; AlGaAs:Zn; GaAs:Zn; III-V semiconductors; InAlAs:Zn; InGaAsP:Zn; InP:Zn; SiO2; SiO2 mask; Zn diffusion technique; electrically active Zn; gettering; homogenization; local diffusion; mask dielectric properties; polymer diffusants; polymer spin-on films; surface morphology; Gallium arsenide; III-V semiconductor materials; Indium gallium arsenide; Indium phosphide; Polymer films; Raman scattering; Semiconductor impurities; Spectroscopy; Temperature; Zinc;
Conference_Titel :
Indium Phosphide and Related Materials, 1996. IPRM '96., Eighth International Conference on
Conference_Location :
Schwabisch-Gmund
Print_ISBN :
0-7803-3283-0
DOI :
10.1109/ICIPRM.1996.492047