• DocumentCode
    2963327
  • Title

    An empirical study of the sample size variability of optimal active learning using Gaussian process regression

  • Author

    Yeh, Flora Yu-Hui ; Gallagher, Marcus

  • Author_Institution
    Sch. of Inf. Technol. & Electr. Eng., Univ. of Queensland, Brisbane, QLD
  • fYear
    2008
  • fDate
    1-8 June 2008
  • Firstpage
    3787
  • Lastpage
    3794
  • Abstract
    Optimal active learning refers to a framework where the learner actively selects data points to be added to its training set in a statistically optimal way. Under the assumption of log-loss, optimal active learning can be implemented in a relatively simple and efficient manner for regression problems using Gaussian processes. However (to date), there has been little attempt to study the experimental behavior and performance of this technique. In this paper, we present a detailed empirical evaluation of optimal active learning using Gaussian processes across a set of seven regression problems from the DELVE repository. In particular, we examine the evaluation of optimal active learning compared to making random queries and the impact of experimental factors such as the size and construction of the different sub-datasets used as part of training and testing the models. It is shown that the multiple sources of variability can be quite significant and suggests that more care needs to be taken in the evaluation of active learning algorithms.
  • Keywords
    Gaussian processes; data handling; learning (artificial intelligence); regression analysis; sampling methods; DELVE repository; Gaussian process regression; optimal active learning; sample size variability; subdataset; Design for experiments; Engines; Gaussian processes; Labeling; Machine learning; Machine learning algorithms; Performance evaluation; Supervised learning; Testing; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 2008. IJCNN 2008. (IEEE World Congress on Computational Intelligence). IEEE International Joint Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1098-7576
  • Print_ISBN
    978-1-4244-1820-6
  • Electronic_ISBN
    1098-7576
  • Type

    conf

  • DOI
    10.1109/IJCNN.2008.4634342
  • Filename
    4634342