Title :
Large scale PICs in III-Vs-unique problems and opportunities
Author :
Joyner, Charles H.
Author_Institution :
Crawford Hill Labs., Lucent Technol. Inc., Holmdel, NJ, USA
Abstract :
The last 5 years have been an extremely exciting time for semiconductor device physics. Advances in growth techniques and substrate quality have allowed monolayer abrupt structures with high degrees of thickness and compositional uniformity over large areas to become routine. The introduction of strain has taught us a great deal about the band structure of semiconductors as well as enabling us to greatly improve active device performance. The techniques of selective area growth and etching now provide a technological platform for photonic integration that has yielded record breaking research devices as well as commercial products in a very short time. Clever designs using all of the above are creating easily packaged components and subsystems which can lower the cost of photonics to a degree that makes them accessible to every area of communication. In this paper we review a number of recent milestones and examine the opportunities and challenges to photonic integration for the future
Keywords :
III-V semiconductors; etching; integrated circuit technology; integrated optoelectronics; semiconductor growth; III-V materials; OEIC; fabrication; large scale PIC; monolithic integration; photonic IC; photonic integration; selective area etching; selective area growth; Assembly; Costs; III-V semiconductor materials; Integrated optics; Isolators; Large-scale systems; Optical devices; Optical losses; Packaging; Wet etching;
Conference_Titel :
Indium Phosphide and Related Materials, 1996. IPRM '96., Eighth International Conference on
Conference_Location :
Schwabisch-Gmund
Print_ISBN :
0-7803-3283-0
DOI :
10.1109/ICIPRM.1996.492274