DocumentCode :
296346
Title :
Enhanced luminescence of near-surface quantum wells passivated in situ by InP
Author :
Lipsanen, H. ; Sopanen, M. ; Taskinen, M. ; Tulkki, J. ; Ahopelto, J.
Author_Institution :
Optoelectron. Lab., Helsinki Univ. of Technol., Espoo, Finland
fYear :
1996
fDate :
21-25 Apr 1996
Firstpage :
490
Lastpage :
493
Abstract :
The authors report optical properties of in situ passivated AlGaAs and GaAs surfaces. The deposition of an ultra thin InP layer (about one monolayer) on the surface of AlGaAs/GaAs structures by metalorganic vapor phase epitaxy (MOVPE) results in drastically reduced surface recombination. The effect is studied by low-temperature photoluminescence (PL) of near-surface AlGaAs/GaAs quantum wells (QW) where the top barrier thickness is varied from 0 to 50 nm. At the thickness of 15 nm the intensity from passivated samples is more than four orders of magnitude larger than obtained from unpassivated structures. Photoreflectance (PR) measurements are used to determine the Fermi level pinning at the surface. The InP passivation is shown to reduce the surface pinning by about 0.3 eV
Keywords :
Fermi level; III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; interface states; passivation; photoluminescence; photoreflectance; semiconductor growth; semiconductor quantum wells; spectral line intensity; surface recombination; vapour phase epitaxial growth; 0 to 50 nm; AlGaAs/GaAs structures; Fermi level pinning; GaAlAs-AlAs-InP; InP; InP passivation; MOVPE; enhanced luminescence; in situ passivated AlGaAs/GaAs surfaces; low-temperature photoluminescence; metalorganic vapor phase epitaxy; near-surface AlGaAs/GaAs quantum wells; near-surface quantum wells; optical properties; passivated samples; photoreflectance; surface pinning; surface recombination; top barrier thickness; ultra thin InP layer; unpassivated structures; Buffer layers; Epitaxial growth; Epitaxial layers; Gallium arsenide; Indium phosphide; Luminescence; Optical buffering; Passivation; Quantum dots; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1996. IPRM '96., Eighth International Conference on
Conference_Location :
Schwabisch-Gmund
Print_ISBN :
0-7803-3283-0
Type :
conf
DOI :
10.1109/ICIPRM.1996.492289
Filename :
492289
Link To Document :
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