• DocumentCode
    2963716
  • Title

    Plated copper on ceramic for power hybrid applications

  • Author

    Weeks, Richard ; Johnson, R. Wayne ; Hopkins, Douglas ; Muir, James ; Williams, Janette R.

  • Author_Institution
    Dept. of Electr. Eng., Auburn Univ., AL, USA
  • fYear
    1989
  • fDate
    22-24 May 1989
  • Firstpage
    544
  • Lastpage
    550
  • Abstract
    A technique for plating copper onto ceramic with top layers of nickel, gold, and/or solder is described. The adhesion mechanism of the copper is an interlocking of the film and ceramic surface to form a mechanical bond. Soldered adhesion of the copper did not degrade during high-temperature storage or thermal cycling. A nickel barrier between the plated copper and solder inhibits diffusion and intermetallic formation. Testing of small-diameter gold and large-diameter aluminum wire bonds after high-temperature storage demonstrated the reliability of wire bonding to the Cu/Ni/Au metallization. While a small percentage of bond lifts occurred among the aluminum-wire-bond samples stored at 200°C, the bond strengths were high and there was no increase in series bond resistance. Preliminary evaluation of a screen-printable polyimide encapsulant revealed pinholes in the cured film. Alternate polyimide formulations are being evaluated. A 2-MHz, 100-W DC-DC converter was fabricated to demonstrate the use of plated copper on ceramic substrate technology
  • Keywords
    copper; electroplated coatings; encapsulation; hybrid integrated circuits; integrated circuit technology; metallisation; power convertors; power integrated circuits; soldering; 100 W; 2 MHz; 200 C; Cu-Au; Cu-Ni; Cu-Ni-Au; Cu-PbSn; DC-DC converter; bond resistance; bond strengths; ceramic substrate technology; metallisation; plating technique; power circuit hybridisation; screen-printable polyimide encapsulant; soldered adhesion; thermal cycling; wire bonding; Adhesives; Bonding; Ceramics; Copper; Gold; Intermetallic; Nickel; Polyimides; Thermal degradation; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components Conference, 1989. Proceedings., 39th
  • Conference_Location
    Houston, TX
  • Type

    conf

  • DOI
    10.1109/ECC.1989.77803
  • Filename
    77803