DocumentCode
2963752
Title
Large-scale patent classification with min-max modular support vector machines
Author
Chu, Xiao-Lei ; Ma, Chao ; Li, Jing ; Lu, Bao-Liang ; Utiyama, Masao ; Isahara, Hitoshi
Author_Institution
Dept. of Comput. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai
fYear
2008
fDate
1-8 June 2008
Firstpage
3973
Lastpage
3980
Abstract
Patent classification is a large-scale, hierarchical, imbalanced, multi-label problem. The number of samples in a real-world patent classification typically exceeds one million, and this number increases every year. An effective patent classifier must be able to deal with this situation. This paper discusses the use of min-max modular support vector machine (M3-SVM) to deal with large-scale patent classification problems. The method includes three steps: decomposing a large-scale and imbalanced patent classification problem into a group of relatively smaller and more balanced two-class subproblems which are independent of each other, learning these subproblems using support vector machines (SVMs) in parallel, and combining all of the trained SVMs according to the minimization and the maximization rules. M3-SVM has two attractive features which are urgently needed to deal with large-scale patent classification problems. First, it can be realized in a massively parallel form. Second, it can be built up incrementally. Results from experiments using the NTCIR-5 patent data set, which contains more than two million patents, have confirmed these two attractive features, and demonstrate that M3-SVM outperforms conventional SVMs in terms of both training time and generalization performance.
Keywords
optimisation; patents; pattern classification; support vector machines; maximization rules; min-max modular support vector machines; minimization rules; multilabel problem; patent classification; patent classifier; Chaos; Databases; Humans; Large-scale systems; Machine learning; Neural networks; Pattern classification; Scalability; Support vector machine classification; Support vector machines;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks, 2008. IJCNN 2008. (IEEE World Congress on Computational Intelligence). IEEE International Joint Conference on
Conference_Location
Hong Kong
ISSN
1098-7576
Print_ISBN
978-1-4244-1820-6
Electronic_ISBN
1098-7576
Type
conf
DOI
10.1109/IJCNN.2008.4634369
Filename
4634369
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