• DocumentCode
    2964068
  • Title

    A series of demonstrators to assess technologies for silicon hybrid multichip modules

  • Author

    Early, L.C.

  • Author_Institution
    Mars Electron., Malvern, UK
  • fYear
    1989
  • fDate
    22-24 May 1989
  • Firstpage
    557
  • Lastpage
    561
  • Abstract
    In order to exploit the full advantages of today´s high-density, high-speed, high I/O count VLSI devices, an advanced interconnect technology is required. One such technology is that of silicon hybrid multichip modules (MCMs). The advantages of using silicon as a hybrid substrate is illustrated through a series of process and functional demonstrators. The use of the demonstrators to investigate the various technologies available for chip-attach and substrate-interconnect fabrication is discussed
  • Keywords
    VLSI; elemental semiconductors; hybrid integrated circuits; integrated circuit technology; packaging; silicon; substrates; Si hybrid multichip modules; high I/O count VLSI devices; high speed VLSI device; hybrid substrate; interconnect technology; semiconductor; substrate-interconnect fabrication; Aluminum; Bonding; Dielectric constant; Dielectric substrates; Integrated circuit interconnections; Metallization; Multichip modules; Polyimides; Silicon; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components Conference, 1989. Proceedings., 39th
  • Conference_Location
    Houston, TX
  • Type

    conf

  • DOI
    10.1109/ECC.1989.77805
  • Filename
    77805