DocumentCode :
2964140
Title :
Artificial neural network application for magnetic core width prediction and modelling
Author :
Paguio, H.J.S. ; Dadios, Elmer P.
Author_Institution :
Electron. & Commun. Eng. Dept., De La Salle Univ. - Manila, Manila, Philippines
fYear :
2012
fDate :
19-22 Nov. 2012
Firstpage :
1
Lastpage :
6
Abstract :
Increased demands for higher storage capacity solution have driven the Hard Disk Drive (HDD) technological boundaries. As the Perpendicular Magnetic Recording (PMR) head shows promising increase in Areal Density away from the limit of Longitudinal Magnetic Recording, HDD companies have switch to 100% PMR drives. PMR heads requires tight physical specifications fabricating its Writer Element in order control the magnetic flux footprint of the writer on the disk. This magnetic footprint is also called the MCW (Magnetic Core Width). MCW variations in PMR head results to significant yield loss in DET (Dynamic Electrical Test). In addition to that, continuous tweaking in Wafer and Slider Fab process to improve yield contributes to changes in MCW performance during DET. A new method that will learn and predict the MCW model accurately is thus necessary to successfully control MCW variation. An Artificial Neural Network Multilayer Perceptron architecture was developed and used to derive the MCW model from Wafer & Slider process parameters. The Artificial Neural Network model was compared with conventional Multiple Linear Regression (MLR) method and has shown that ANN gives better accuracy in predicting the final MCW than MLR by 30%.
Keywords :
disc drives; electronic equipment testing; hard discs; magnetic cores; magnetic heads; multilayer perceptrons; perpendicular magnetic recording; semiconductor technology; DET; HDD companies; MCW model; MCW performance; MCW variation control; PMR drives; PMR head; areal density; artificial neural network application; artificial neural network multilayer perceptron architecture; continuous tweaking; dynamic electrical test; hard disk drive technological boundaries; longitudinal magnetic recording; magnetic core width modelling; magnetic core width prediction; magnetic flux footprint; perpendicular magnetic recording head; physical specifications; storage capacity solution; wafer and slider fabrication process; wafer and slider process parameters; writer element; Artificial neural networks; Convergence; Magnetic heads; Magnetic recording; Neurons; Semiconductor device modeling; Training; Artificial Neural Network; HDD Head Manufacturing; Modelling; Neural Network; Slider Fabrication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2012 - 2012 IEEE Region 10 Conference
Conference_Location :
Cebu
ISSN :
2159-3442
Print_ISBN :
978-1-4673-4823-2
Electronic_ISBN :
2159-3442
Type :
conf
DOI :
10.1109/TENCON.2012.6412209
Filename :
6412209
Link To Document :
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