DocumentCode :
2964601
Title :
Characterization parameters and modelling of high frequency nonlinear devices require new calibration techniques
Author :
Vanden Bossche, M.
Author_Institution :
Hewlett Packard NMDG, Brussels, Belgium
fYear :
1998
fDate :
6-10 July 1998
Firstpage :
487
Lastpage :
488
Abstract :
The fast growing telecommunication market is suffering from the lack of good characterization and modelling tools for high frequency nonlinear devices and systems. This paper argues that accurate broadband measurements of incident and reflected waves or voltage and currents at the device ports are the essential foundation for any solution to high frequency nonlinear problems. To establish these measurement techniques in industry, there is a need for an additional calibration standard to make the measurements traceable.
Keywords :
S-parameters; calibration; microwave reflectometry; network analysers; nonlinear network analysis; oscilloscopes; signal sampling; telecommunication equipment testing; wave analysers; waveform analysis; S parameters; accurate broadband measurements; calibration standard; calibration techniques; current waveforms measurement; device characterization; device modelling; device ports; high frequency nonlinear devices; incident waves; nose-to-nose calibration; reflected waves; sampling oscilloscopes; systematic errors; traceable measurements; transfer function; vector network analysers; voltage waveforms measurement; Calibration; Circuits; Costs; Current measurement; Defense industry; Europe; Frequency measurement; Measurement standards; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
Type :
conf
DOI :
10.1109/CPEM.1998.700018
Filename :
700018
Link To Document :
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