• DocumentCode
    2964601
  • Title

    Characterization parameters and modelling of high frequency nonlinear devices require new calibration techniques

  • Author

    Vanden Bossche, M.

  • Author_Institution
    Hewlett Packard NMDG, Brussels, Belgium
  • fYear
    1998
  • fDate
    6-10 July 1998
  • Firstpage
    487
  • Lastpage
    488
  • Abstract
    The fast growing telecommunication market is suffering from the lack of good characterization and modelling tools for high frequency nonlinear devices and systems. This paper argues that accurate broadband measurements of incident and reflected waves or voltage and currents at the device ports are the essential foundation for any solution to high frequency nonlinear problems. To establish these measurement techniques in industry, there is a need for an additional calibration standard to make the measurements traceable.
  • Keywords
    S-parameters; calibration; microwave reflectometry; network analysers; nonlinear network analysis; oscilloscopes; signal sampling; telecommunication equipment testing; wave analysers; waveform analysis; S parameters; accurate broadband measurements; calibration standard; calibration techniques; current waveforms measurement; device characterization; device modelling; device ports; high frequency nonlinear devices; incident waves; nose-to-nose calibration; reflected waves; sampling oscilloscopes; systematic errors; traceable measurements; transfer function; vector network analysers; voltage waveforms measurement; Calibration; Circuits; Costs; Current measurement; Defense industry; Europe; Frequency measurement; Measurement standards; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 1998 Conference on
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    0-7803-5018-9
  • Type

    conf

  • DOI
    10.1109/CPEM.1998.700018
  • Filename
    700018