Title :
Electro-optic probing of microwave circuits
Author :
Dudley, R.A. ; Roddie, A.G. ; Bannister, D.J. ; Krems, T. ; Facon, P.
Author_Institution :
Nat. Phys. Lab., Teddington, UK
Abstract :
We present an S-parameter measurement system based on electro-optic sampling for the on-wafer testing of microwave integrated circuits. The advantages of non-invasive electro-optic testing over conventional network analyser systems are discussed for passive, active and analogue circuits up to 20 GHz. The measurement procedures, repeatability and uncertainty in measurements are reported.
Keywords :
MMIC; S-parameters; calibration; integrated circuit measurement; integrated circuit testing; measurement uncertainty; microwave measurement; network analysers; signal sampling; 20 GHz; CPW circuit; MMIC; S-parameter measurement system; active circuits; analogue circuits; calibration method; electro-optic probing; electro-optic sampling; microwave integrated circuits; noninvasive electro-optic testing; on-wafer testing; passive circuits; repeatability; uncertainty; Circuit testing; Integrated circuit measurements; Integrated circuit testing; Measurement uncertainty; Microwave circuits; Microwave integrated circuits; Microwave measurements; Sampling methods; Scattering parameters; System testing;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.700019
