Electro-optic probing of microwave circuits

Author

Dudley, R.A. ; Roddie, A.G. ; Bannister, D.J. ; Krems, T. ; Facon, P.

Author_Institution

Nat. Phys. Lab., Teddington, UK

fYear

1998

fDate

6-10 July 1998

Firstpage

489

Lastpage

490

Abstract

We present an S-parameter measurement system based on electro-optic sampling for the on-wafer testing of microwave integrated circuits. The advantages of non-invasive electro-optic testing over conventional network analyser systems are discussed for passive, active and analogue circuits up to 20 GHz. The measurement procedures, repeatability and uncertainty in measurements are reported.

Keywords

MMIC; S-parameters; calibration; integrated circuit measurement; integrated circuit testing; measurement uncertainty; microwave measurement; network analysers; signal sampling; 20 GHz; CPW circuit; MMIC; S-parameter measurement system; active circuits; analogue circuits; calibration method; electro-optic probing; electro-optic sampling; microwave integrated circuits; noninvasive electro-optic testing; on-wafer testing; passive circuits; repeatability; uncertainty; Circuit testing; Integrated circuit measurements; Integrated circuit testing; Measurement uncertainty; Microwave circuits; Microwave integrated circuits; Microwave measurements; Sampling methods; Scattering parameters; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements Digest, 1998 Conference on

Conference_Location

Washington, DC, USA

Print_ISBN

0-7803-5018-9

Type

conf

DOI

10.1109/CPEM.1998.700019

Filename

700019