Title :
TU3F: Advances in CAD Techniques
Keywords :
Computational modeling; Computer simulation; Design automation; Design optimization; Robustness; Time to market;
Conference_Titel :
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
1-4244-0688-9
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2007.380262