Title :
A proposed measurement of controlled defect induction and annealing in a carbon nanotube
Author :
Gannett, Will ; Begtrup, G.E. ; Zettl, Alex
Author_Institution :
Dept. of Phys., Univ. of California at Berkeley, Berkeley, CA
Abstract :
We propose controlled creation and annealing of defects in carbon nanotubes by plasma and current application, respectively. TEM is used to map nanoparticles, which nucleate at defect sites and act as position markers.
Keywords :
annealing; carbon nanotubes; crystal defects; nucleation; annealing; carbon nanotube; controlled defect induction; Annealing; Carbon nanotubes; Gold; Nanoparticles; Nanotube devices; Organic materials; Physics; Plasma devices; Plasma materials processing; Plasma measurements;
Conference_Titel :
Nano-Optoelectronics Workshop, 2008. i-NOW 2008. International
Conference_Location :
Shonan Village
Print_ISBN :
978-1-4244-2656-0
DOI :
10.1109/INOW.2008.4634473
