Title :
SAW UV sensors using ZnO nanorods grown on AlN/Si structures
Author :
Phan, Duy-Thach ; Chung, Gwiy-Sang
Author_Institution :
Sch. of Electr. Eng., Univ. of Ulsan, Ulsan, South Korea
Abstract :
In this study, we demonstrate the ZnO nanorods grown on aluminum nitride (AlN)/silicon (Si) layered structure to obtain surface acoustic wave (SAW) UV sensor. The ZnO nanorods act as high UV sensing material due to large surface-to-volume ratio. The X-ray Diffraction (XRD) and photoluminescence (PL) spectra showed that the ZnO nanorods grown on AlN/Si had highly (002)-oriented and good optical properties. The piece of ZnO nannorods grown at center of two-port SAW delay line, which based on inter-digital transducer (IDT)/AlN/Si structure was fabricated and exposed under UV light. Resulting in the SAW UV sensor shifted a maximum of 26 kHz under the UV intensity of 0.6 mW/cm2.
Keywords :
X-ray diffraction; aluminium compounds; photoluminescence; silicon; surface acoustic wave sensors; zinc compounds; AlN-Si; SAW UV sensors; ZnO; ZnO nanorods; aluminum nitride; photoluminescence spectra; surface to volume ratio; x ray diffraction; Films; Optical surface waves; Sensors; Silicon; Surface acoustic waves; Surface morphology; Zinc oxide;
Conference_Titel :
Sensors, 2011 IEEE
Conference_Location :
Limerick
Print_ISBN :
978-1-4244-9290-9
DOI :
10.1109/ICSENS.2011.6126946