• DocumentCode
    2965465
  • Title

    Dynamic characterization of surface mount component leads for solder joint inspection

  • Author

    Lau, John H. ; Keely, Catherine A.

  • Author_Institution
    Hewlett-Packard Lab., Palo Alto, CA, USA
  • fYear
    1989
  • fDate
    22-24 May 1989
  • Firstpage
    603
  • Lastpage
    615
  • Abstract
    Vibration frequencies of soldered and unsoldered leads of surface mount small-outline integrated circuits (SOICs), plastic leaded chip carriers (PLCCs), and plastic quad flat packs (PQFPs) are calculated using the finite-element method. The corresponding mode shapes of the leads and solder joints are provided for a better understanding of their dynamic characteristics. It is found that the fundamental frequency of all the soldered leads is at least five times larger than that of the unsoldered leads. A laser Doppler vibrometer method has been developed to measure the frequency of soldered and unsoldered leads of these surface mount components. Experiment and theory are in close agreement. The results presented should be useful for determining the reliability of solder joints under shock and vibration conditions and for solder joint inspection during a controlled manufacturing process
  • Keywords
    dynamic testing; finite element analysis; frequency measurement; inspection; integrated circuit technology; packaging; soldering; surface mount technology; PLCC; PQFP; SOIC; controlled manufacturing process; dynamic characteristics; finite-element method; fundamental frequency; laser Doppler vibrometer method; plastic leaded chip carriers; plastic quad flat packs; reliability; solder joint inspection; surface mount component leads; surface mount small-outline integrated circuits; vibration frequencies; Electronics packaging; Finite element methods; Frequency; Laser modes; Laser theory; Lead; Plastics; Shape; Soldering; Vibrometers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components Conference, 1989. Proceedings., 39th
  • Conference_Location
    Houston, TX
  • Type

    conf

  • DOI
    10.1109/ECC.1989.77813
  • Filename
    77813