DocumentCode
2965465
Title
Dynamic characterization of surface mount component leads for solder joint inspection
Author
Lau, John H. ; Keely, Catherine A.
Author_Institution
Hewlett-Packard Lab., Palo Alto, CA, USA
fYear
1989
fDate
22-24 May 1989
Firstpage
603
Lastpage
615
Abstract
Vibration frequencies of soldered and unsoldered leads of surface mount small-outline integrated circuits (SOICs), plastic leaded chip carriers (PLCCs), and plastic quad flat packs (PQFPs) are calculated using the finite-element method. The corresponding mode shapes of the leads and solder joints are provided for a better understanding of their dynamic characteristics. It is found that the fundamental frequency of all the soldered leads is at least five times larger than that of the unsoldered leads. A laser Doppler vibrometer method has been developed to measure the frequency of soldered and unsoldered leads of these surface mount components. Experiment and theory are in close agreement. The results presented should be useful for determining the reliability of solder joints under shock and vibration conditions and for solder joint inspection during a controlled manufacturing process
Keywords
dynamic testing; finite element analysis; frequency measurement; inspection; integrated circuit technology; packaging; soldering; surface mount technology; PLCC; PQFP; SOIC; controlled manufacturing process; dynamic characteristics; finite-element method; fundamental frequency; laser Doppler vibrometer method; plastic leaded chip carriers; plastic quad flat packs; reliability; solder joint inspection; surface mount component leads; surface mount small-outline integrated circuits; vibration frequencies; Electronics packaging; Finite element methods; Frequency; Laser modes; Laser theory; Lead; Plastics; Shape; Soldering; Vibrometers;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components Conference, 1989. Proceedings., 39th
Conference_Location
Houston, TX
Type
conf
DOI
10.1109/ECC.1989.77813
Filename
77813
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