DocumentCode :
2965890
Title :
Analysis of materials and structure tradeoffs in thin and thick film multi-chip packages
Author :
Krusius, J.P. ; Pence, W.E.
Author_Institution :
Dept. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
fYear :
1989
fDate :
22-24 May 1989
Firstpage :
641
Lastpage :
646
Abstract :
System simulation, a new design methodology for electronic packages, has been used to study multichip module tradeoffs. Modules are described by a set of structural, electrical, and materials-related model parameters. Parameters cover wide ranges that include multilayer ceramic, thin-film, and polyimide-on-ceramic technologies. For the present study 1.5-μm CMOS chip technology and 1.4-mil-line-width, 100-mil-grid-space printed wiring board technology are used. Modules have been optimized for three cases using the simulated annealing technique: maximum module clock frequency, maximum board-level clock frequency, and optimum system performance. Many similar mathematical solutions are typically found, an indication of the complexity of the response surface. The examples demonstrate the power of package system simulation for identifying, quantifying, and predicting design, development, and tradeoff issues and solutions for multichip modules
Keywords :
CMOS integrated circuits; integrated circuit technology; modules; packaging; CMOS chip technology; design methodology; electronic packages; maximum board-level clock frequency; maximum module clock frequency; model parameters; multichip module; multilayer ceramic technology; optimum system performance; package system simulation; polyimide-on-ceramic technologies; printed wiring board technology; simulated annealing technique; thick film multichip packages; thin film multichip packages; CMOS technology; Ceramics; Clocks; Design methodology; Electronics packaging; Frequency; Multichip modules; Nonhomogeneous media; Semiconductor device modeling; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components Conference, 1989. Proceedings., 39th
Conference_Location :
Houston, TX
Type :
conf
DOI :
10.1109/ECC.1989.77818
Filename :
77818
Link To Document :
بازگشت