Title :
Fully Automatic hp Adaptivity for Electromagnetics, Application to the Analysis of H-Plane and E-Plane Rectangular Waveguide Discontinuities
Author :
Castillo, Luis E García ; Zubiaur, David Pardo ; Demkowicz, Leszek F.
Author_Institution :
Univ. Carlos III de Madrid, Madrid
Abstract :
Within the finite element method, the hp-adaptivity, i.e., the simultaneous combination of the h (local variations in element size) and p (local variations in the polynomial order of approximation) adaptivities, is the most powerful and flexible type of adaptivity. In this paper, a fully automatic hp-adaptive finite element method for electromagnetics is presented. The adaptive strategy delivers exponential convergence rates for the error even in the presence of singularities. The hp adaptivity is presented in the context of the two dimensional problem consisting in the analysis of H-plane and E-plane rectangular waveguide discontinuities. Stabilized variational formulations and H(curl) FEM discretizations in terms of quadrangles of variable order of approximation supporting anisotropy and hanging nodes are used. A wide variety of structures have been analyzed, and their scattering parameters computed. Results for two structures are presented.
Keywords :
S-parameters; finite element analysis; rectangular waveguides; variational techniques; waveguide discontinuities; E-plane rectangular waveguide; H-plane rectangular waveguide; approximation supporting anisotropy; electromagnetics; exponential convergence rates; finite element method; hanging nodes; hp adaptivity; stabilized variational formulation; two dimensional problem; waveguide discontinuities; Anisotropic magnetoresistance; Convergence; Electromagnetic analysis; Electromagnetic scattering; Electromagnetic waveguides; Finite element methods; Polynomials; Rectangular waveguides; Scattering parameters; Waveguide discontinuities; Finite element methods; rectangular waveguides; waveguide discontinuities;
Conference_Titel :
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-0688-9
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2007.380406