A product platform optimization method based on QFD

Author

Luo, X.G. ; Tang, J.F. ; Kwong, C.K.

Author_Institution

Sch. of Inf. Sci. & Eng., Northeastern Univ., Shenyang, China

fYear

2009

fDate

8-11 Dec. 2009

Firstpage

1317

Lastpage

1321

Abstract

Quality function deployment (QFD) is a popular approach to design products that satisfy customer needs. To minimize the total quality loss caused by commonality when establishing a product platform and better satisfy customer requirements, this paper presents a five-step QFD-based methodology to determine the optimal values for platform engineering characteristics (ECs) and non-platform ECs of the products within a product family. First, the optimal values of ECs for each individual product within a family are determined. Then, the platform ECs are identified according to the calculated sensitivity indices of the ECs, and the values of each platform EC are clustered. A mathematical model is developed to simultaneously optimize the values of the platform and the non-platform ECs. Finally, the ECs that the worst overall customer satisfaction loss can be avoided are selected as platform ECs. A case study is used to demonstrate the methodology.

Keywords

customer satisfaction; minimisation; product design; quality function deployment; customer needs satisfaction; mathematical model; platform engineering characteristics; product design; product platform optimization method; quality function deployment; total quality loss minimisation; Costs; Customer satisfaction; Design engineering; Design methodology; Manufacturing; Mathematical model; Optimization methods; Process design; Product design; Quality function deployment; customer requirements; optimization; product platform; quality function deployment (QFD);

fLanguage

English

Publisher

ieee

Conference_Titel

Industrial Engineering and Engineering Management, 2009. IEEM 2009. IEEE International Conference on

Conference_Location

Hong Kong

Print_ISBN

978-1-4244-4869-2

Electronic_ISBN

978-1-4244-4870-8

Type

conf

DOI

10.1109/IEEM.2009.5373023

Filename

5373023