Title :
Design of Digital Dipmeter Based on MEMS Accelerometer and SOC MCU
Author :
Xiaomin, Duan ; Jun, Liu ; Jie, Li ; Wei, Yang ; Hao, Xian
Author_Institution :
Key Lab. of Instrum. Sci. & Dynamic Meas., North Univ. of China, Taiyuan, China
Abstract :
A new type digital inclination angle measuring instrument is researched, which includes a low power, low noise, low cost MEMS accelerometer and a fully integrated mixed signal System-On-a-Chip MCU C8051F040. The signal processing of MEMS accelerometer is divided into conditioning, sampling, converting, and temperature compensation, then calculating the inclination angle value, and displaying the angle on LCD monitor. The high accuracy tree-axis test turntable is used to calibration test the digital inclination angle measuring instrument. This inclination angle measuring instrument features small size, light weight, high precision, low cost, and can be widely used in building, machinery, roads, bridges, geological exploration, and other situation with gravity reference to measure the inclination angle.
Keywords :
accelerometers; angular measurement; calibration; liquid crystal displays; microcontrollers; microsensors; system-on-chip; LCD monitor; MEMS accelerometer; SOC MCU; calibration test; digital dipmeter; digital inclination angle measuring instrument; fully integrated mixed signal system-on-a-chip MCU; gravity reference; Acceleration; Accelerometers; Clocks; Geologic measurements; Instruments; Micromechanical devices; Temperature measurement; MEMS; accelerometer; error compensation; inclination;
Conference_Titel :
Intelligent Computation Technology and Automation (ICICTA), 2011 International Conference on
Conference_Location :
Shenzhen, Guangdong
Print_ISBN :
978-1-61284-289-9
DOI :
10.1109/ICICTA.2011.557
