DocumentCode
2966680
Title
Quality control of architecutural design based on uniform technical standards
Author
Chen, Fan ; Chen, Jun ; Li, S.T.
Author_Institution
Sch. of Civil Eng. & Archit., Zhejiang Univ., Hangzhou, China
fYear
2009
fDate
8-11 Dec. 2009
Firstpage
1362
Lastpage
1365
Abstract
The quality of architectural design mostly rested with the individual performance of architects in the past. Today, with the increasing development of technical level, the quality of a design project more than ever before entails the cooperation among different professions involved and the teamwork of a professional team. The engineers and scholars, however, tend to disregard the errors in cross-professional communication and the unnecessary duplicate labor which cause problems for the quality of design. Based on the theory of Total Quality Management systems, the thesis suggests that a series of feasible technical standards be established within an institute of architectural design for quality control. Specifically, we adopt the PDCA cycle by dividing it into four stages: Planning of technical standards, Doing of technical standards, Checking of technical standards, and Acting of technical standards. Finally, this essay will make a conclusion and give some suggestions on technical standard-setting.
Keywords
architecture; design; quality control; standards; total quality management; architecutural design; quality control; quality of design; technical standards; total quality management; Civil engineering; Communication system control; Control systems; Design engineering; Design for quality; Quality control; Quality management; Standards development; Teamwork; Total quality management; process; quality control; technical standard; the Quality Management in architectural design;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Engineering and Engineering Management, 2009. IEEM 2009. IEEE International Conference on
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-4869-2
Electronic_ISBN
978-1-4244-4870-8
Type
conf
DOI
10.1109/IEEM.2009.5373036
Filename
5373036
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