• DocumentCode
    2966680
  • Title

    Quality control of architecutural design based on uniform technical standards

  • Author

    Chen, Fan ; Chen, Jun ; Li, S.T.

  • Author_Institution
    Sch. of Civil Eng. & Archit., Zhejiang Univ., Hangzhou, China
  • fYear
    2009
  • fDate
    8-11 Dec. 2009
  • Firstpage
    1362
  • Lastpage
    1365
  • Abstract
    The quality of architectural design mostly rested with the individual performance of architects in the past. Today, with the increasing development of technical level, the quality of a design project more than ever before entails the cooperation among different professions involved and the teamwork of a professional team. The engineers and scholars, however, tend to disregard the errors in cross-professional communication and the unnecessary duplicate labor which cause problems for the quality of design. Based on the theory of Total Quality Management systems, the thesis suggests that a series of feasible technical standards be established within an institute of architectural design for quality control. Specifically, we adopt the PDCA cycle by dividing it into four stages: Planning of technical standards, Doing of technical standards, Checking of technical standards, and Acting of technical standards. Finally, this essay will make a conclusion and give some suggestions on technical standard-setting.
  • Keywords
    architecture; design; quality control; standards; total quality management; architecutural design; quality control; quality of design; technical standards; total quality management; Civil engineering; Communication system control; Control systems; Design engineering; Design for quality; Quality control; Quality management; Standards development; Teamwork; Total quality management; process; quality control; technical standard; the Quality Management in architectural design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management, 2009. IEEM 2009. IEEE International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-4869-2
  • Electronic_ISBN
    978-1-4244-4870-8
  • Type

    conf

  • DOI
    10.1109/IEEM.2009.5373036
  • Filename
    5373036