• DocumentCode
    2967074
  • Title

    WE2D: Material Measurement

  • fYear
    2007
  • fDate
    3-8 June 2007
  • Firstpage
    513
  • Lastpage
    513
  • Keywords
    Conducting materials; Conductivity measurement; Dielectric materials; Dielectric measurements; Dielectric substrates; Laminates; Magnetic materials; Measurement techniques; NIST; Permittivity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 2007. IEEE/MTT-S International
  • Conference_Location
    Honolulu, HI, USA
  • ISSN
    0149-645X
  • Print_ISBN
    1-4244-0688-9
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2007.380520
  • Filename
    4263863
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2967074