مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2967074

Title :

WE2D: Material Measurement

fYear :

2007

fDate :

3-8 June 2007

Firstpage :

513

Lastpage :

513

Keywords :

Conducting materials; Conductivity measurement; Dielectric materials; Dielectric measurements; Dielectric substrates; Laminates; Magnetic materials; Measurement techniques; NIST; Permittivity measurement;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Microwave Symposium, 2007. IEEE/MTT-S International

Conference_Location :

Honolulu, HI, USA

ISSN :

0149-645X

Print_ISBN :

1-4244-0688-9

Electronic_ISBN :

0149-645X

Type :

conf

DOI :

10.1109/MWSYM.2007.380520

Filename :

4263863

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2967074