DocumentCode :
2967101
Title :
A High-Temperature Capable Planar-type Coaxial Probe for Complex Permittivity Measurements Up to 40 GHz
Author :
Kim, Namgon ; Yoon, Jeonghoon ; Kim, Dongki ; Cho, Jeiwon ; Cheon, Changyul ; Kwon, Youngwoo
Author_Institution :
Seoul Nat. Univ., Seoul
fYear :
2007
fDate :
3-8 June 2007
Firstpage :
519
Lastpage :
522
Abstract :
A planar-type probe applicable to a wide temperature and frequency range has been developed. The probe employs a low CTE (coefficient of thermal expansion) dielectric material to minimize the effect of thermal expansion for high temperature measurement. Additionally, the coaxial aperture dimensions have been optimized through sensitivity analysis to minimize the uncertainty of the extracted complex permittivity due to variations of the measured S-parameters. Also, the error correction method was used at extreme temperatures to compensate for the effects of the excessive thermal expansion. For validation, distilled water was measured from 0degC to 100degC in the frequency range of 0.5~40 GHz. The measured complex permittivity shows good agreement with the reference data up to 75degC without the error correction and up to the boiling point (92degC) with the error correction. To our knowledge, this is the first demonstration of low-cost planar-type probes capable of high temperature operation.
Keywords :
S-parameters; compensation; dielectric materials; error correction; permittivity measurement; probes; sensitivity analysis; thermal expansion; S-parameters; complex permittivity measurements; error correction; frequency 0.5 GHz to 40 GHz; high temperature measurement; high-temperature capable coaxial probe; low CTE dielectric material; planar-type coaxial probe; sensitivity analysis; temperature 0 degC to 100 degC; Coaxial components; Dielectric materials; Error correction; Frequency; Permittivity measurement; Probes; Temperature distribution; Temperature measurement; Temperature sensors; Thermal expansion; Coaxial aperture; complex permittivity; high temperature; planar-type probe; thermal expansion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location :
Honolulu, HI
ISSN :
0149-645X
Print_ISBN :
1-4244-0688-9
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2007.380522
Filename :
4263865
Link To Document :
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