Title :
A new nonlinear HEMT model allowing accurate simulation of very low IM3 levels for high-frequency highly linear amplifiers design
Author :
Lhortolary, J. ; Chang, C. ; Reveyrand, T. ; Camiade, M. ; Campovecchio, M. ; Obregon, J.
Author_Institution :
United Monolithic Semicond., Orsay
Abstract :
Today, confident design of highly linear MMICs is of primary concern for high-frequency applications. Unfortunately, at high frequencies and low output powers, accurate prediction of intermodulation distortions fails with most of the available HEMT models due to nonlinearity extractions based on CW S-parameter measurements at DC bias points or low RF frequency measurements. In this paper, we propose a suitable HEMT model, extracted from pulsed I/V and pulsed S-parameter measurements over a wide frequency range, which allows accurate prediction of intermodulation distortions at both high frequencies and large output power range.
Keywords :
HEMT integrated circuits; MMIC amplifiers; S-parameters; high electron mobility transistors; CW S-parameter measurement; DC bias point; high electron mobility transistor; high-frequency highly linear amplifier design; highly linear MMIC design; low RF frequency measurement; nonlinear HEMT model; Distortion measurement; Frequency measurement; HEMTs; Intermodulation distortion; MMICs; Power amplifiers; Power generation; Predictive models; Pulse measurements; Scattering parameters; HEMT; Intermodulation distortion; high-frequency amplifier; nonlinear model; pulsed measurement;
Conference_Titel :
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-0688-9
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2007.380559