DocumentCode
296749
Title
2 GHz range low loss IIDT filters using narrow gap IDT structure and new cross-over techniques
Author
Yamanouchi, Kazuhiko ; Terashima, Toshikazu
Author_Institution
Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan
Volume
1
fYear
1995
fDate
7-10 Nov 1995
Firstpage
103
Abstract
GHz-range low-loss transducers and filters are required for communication systems, especially mobile telephone communication systems. Many types of low-loss transducers and filters with wide bandwidth utilizing high electro-mechanical coupling coefficient(K2 ) materials such as LiNbO3 and LiTaO3 have been developed. In this paper, we describe SAW filters employing IIDT (Interdigitated Interdigital Transducers) so that the wide bandwidth and the lowest insertion loss can be obtained. The IIDT filters are fabricated on 128° Y-X LiNbO3 by the anodic oxidation techniques with narrow gap IDTs. The electrode width is almost 1 μm for 2 GHz range. Multi-bonding techniques are required for ordinary IIDT filters to connect each group of bus-bars. We have developed a new cross-over connection without the need for multi-bonding. Calculation results, including the cross-over capacitance, show very low loss characteristics. The experimental results showed the insertion loss of 1.19 dB at 2 GHz with the matching condition
Keywords
UHF filters; capacitance; interdigital transducers; land mobile radio; losses; oxidation; surface acoustic wave filters; surface acoustic wave transducers; 1 micron; 1.19 dB; 128° Y-X LiNbO3; 2 GHz; GHz-range low-loss transducers; LiNbO3; SAW filters; anodic oxidation techniques; cross-over capacitance; cross-over techniques; insertion loss; interdigitated interdigital transducers; low loss IIDT filters; mobile telephone communication systems; narrow gap IDT; narrow gap IDT structure; Electrodes; Fingers; Frequency; Insertion loss; Mobile communication; Oxidation; SAW filters; Surface acoustic waves; Transducers; Wideband;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE
Conference_Location
Seattle, WA
ISSN
1051-0117
Print_ISBN
0-7803-2940-6
Type
conf
DOI
10.1109/ULTSYM.1995.495550
Filename
495550
Link To Document