Title :
2 GHz range low loss IIDT filters using narrow gap IDT structure and new cross-over techniques
Author :
Yamanouchi, Kazuhiko ; Terashima, Toshikazu
Author_Institution :
Res. Inst. of Electr. Commun., Tohoku Univ., Sendai, Japan
Abstract :
GHz-range low-loss transducers and filters are required for communication systems, especially mobile telephone communication systems. Many types of low-loss transducers and filters with wide bandwidth utilizing high electro-mechanical coupling coefficient(K2 ) materials such as LiNbO3 and LiTaO3 have been developed. In this paper, we describe SAW filters employing IIDT (Interdigitated Interdigital Transducers) so that the wide bandwidth and the lowest insertion loss can be obtained. The IIDT filters are fabricated on 128° Y-X LiNbO3 by the anodic oxidation techniques with narrow gap IDTs. The electrode width is almost 1 μm for 2 GHz range. Multi-bonding techniques are required for ordinary IIDT filters to connect each group of bus-bars. We have developed a new cross-over connection without the need for multi-bonding. Calculation results, including the cross-over capacitance, show very low loss characteristics. The experimental results showed the insertion loss of 1.19 dB at 2 GHz with the matching condition
Keywords :
UHF filters; capacitance; interdigital transducers; land mobile radio; losses; oxidation; surface acoustic wave filters; surface acoustic wave transducers; 1 micron; 1.19 dB; 128° Y-X LiNbO3; 2 GHz; GHz-range low-loss transducers; LiNbO3; SAW filters; anodic oxidation techniques; cross-over capacitance; cross-over techniques; insertion loss; interdigitated interdigital transducers; low loss IIDT filters; mobile telephone communication systems; narrow gap IDT; narrow gap IDT structure; Electrodes; Fingers; Frequency; Insertion loss; Mobile communication; Oxidation; SAW filters; Surface acoustic waves; Transducers; Wideband;
Conference_Titel :
Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-2940-6
DOI :
10.1109/ULTSYM.1995.495550