DocumentCode
2967499
Title
Virtual Gate Large Signal Model of GaN HFETs
Author
Conway, A.M. ; Asbeck, P.M.
Author_Institution
California Univ., La Jolla
fYear
2007
fDate
3-8 June 2007
Firstpage
605
Lastpage
608
Abstract
This work demonstrates a compact circuit model for GaN HFETs that includes the anomalous transient effect generally referred to as knee voltage walkout. Both the quiescent bias dependence and the time dependence of the transients are included in the model by adding a parasitic transistor in series with the main transistor. The model agrees well with experimental I-V curves and microwave output power versus supply voltage measurements.
Keywords
III-V semiconductors; gallium compounds; high electron mobility transistors; microwave field effect transistors; semiconductor device models; wide band gap semiconductors; GaN; HFET; I-V curves; anomalous transient effect; knee voltage walkout; microwave output power; parasitic transistor; quiescent drain bias; supply voltage measurements; virtual gate large signal model; Circuit synthesis; Gallium nitride; HEMTs; Knee; MODFETs; Microwave transistors; Power amplifiers; Pulse amplifiers; Pulse measurements; Voltage; GaN HFET; Large signal modeling; current slump;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location
Honolulu, HI
ISSN
0149-645X
Print_ISBN
1-4244-0688-9
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2007.379973
Filename
4263888
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