Title :
Virtual Gate Large Signal Model of GaN HFETs
Author :
Conway, A.M. ; Asbeck, P.M.
Author_Institution :
California Univ., La Jolla
Abstract :
This work demonstrates a compact circuit model for GaN HFETs that includes the anomalous transient effect generally referred to as knee voltage walkout. Both the quiescent bias dependence and the time dependence of the transients are included in the model by adding a parasitic transistor in series with the main transistor. The model agrees well with experimental I-V curves and microwave output power versus supply voltage measurements.
Keywords :
III-V semiconductors; gallium compounds; high electron mobility transistors; microwave field effect transistors; semiconductor device models; wide band gap semiconductors; GaN; HFET; I-V curves; anomalous transient effect; knee voltage walkout; microwave output power; parasitic transistor; quiescent drain bias; supply voltage measurements; virtual gate large signal model; Circuit synthesis; Gallium nitride; HEMTs; Knee; MODFETs; Microwave transistors; Power amplifiers; Pulse amplifiers; Pulse measurements; Voltage; GaN HFET; Large signal modeling; current slump;
Conference_Titel :
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-0688-9
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2007.379973