• DocumentCode
    2967499
  • Title

    Virtual Gate Large Signal Model of GaN HFETs

  • Author

    Conway, A.M. ; Asbeck, P.M.

  • Author_Institution
    California Univ., La Jolla
  • fYear
    2007
  • fDate
    3-8 June 2007
  • Firstpage
    605
  • Lastpage
    608
  • Abstract
    This work demonstrates a compact circuit model for GaN HFETs that includes the anomalous transient effect generally referred to as knee voltage walkout. Both the quiescent bias dependence and the time dependence of the transients are included in the model by adding a parasitic transistor in series with the main transistor. The model agrees well with experimental I-V curves and microwave output power versus supply voltage measurements.
  • Keywords
    III-V semiconductors; gallium compounds; high electron mobility transistors; microwave field effect transistors; semiconductor device models; wide band gap semiconductors; GaN; HFET; I-V curves; anomalous transient effect; knee voltage walkout; microwave output power; parasitic transistor; quiescent drain bias; supply voltage measurements; virtual gate large signal model; Circuit synthesis; Gallium nitride; HEMTs; Knee; MODFETs; Microwave transistors; Power amplifiers; Pulse amplifiers; Pulse measurements; Voltage; GaN HFET; Large signal modeling; current slump;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 2007. IEEE/MTT-S International
  • Conference_Location
    Honolulu, HI
  • ISSN
    0149-645X
  • Print_ISBN
    1-4244-0688-9
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2007.379973
  • Filename
    4263888