DocumentCode
2967510
Title
Brazing to low-temperature fired thick films
Author
Keusseyan, R.L. ; Marsh, W.E. ; Prados, R.A. ; Hirsch, R.G.
Author_Institution
DuPont Electron., Research Triangle Park, NC, USA
fYear
1989
fDate
22-24 May 1989
Firstpage
743
Lastpage
747
Abstract
The development of materials and processes for brazing, leads, pins, and heat sinks to alumina ceramic substrates is discussed. The substrates are metallized using either copper-, silver- or gold-based thick film pastes that are fired in the 850-950°C temperature range. The metal ceramic joint strengths obtained are comparable to those obtained using high-temperature fired tungsten or molybdenum-based metallizations
Keywords
alumina; brazing; ceramics; integrated circuit technology; substrates; thick film circuits; 850 to 950 degC; Ag based pastes; Al2O3; Au based pastes; Cu based pastes; alumina ceramic substrates; brazing; heat sinks; leads; low-temperature fired; metal ceramic joint strengths; pins; thick films; Atmosphere; Ceramics; Copper; Heat sinks; Inorganic materials; Lead; Metallization; Pins; Substrates; Thick films;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components Conference, 1989. Proceedings., 39th
Conference_Location
Houston, TX
Type
conf
DOI
10.1109/ECC.1989.77833
Filename
77833
Link To Document