DocumentCode :
296761
Title :
Acceleration sensitivity of SAW and STW devices
Author :
Kosinski, John A.
Author_Institution :
Intelligence & Electron. Warfare Directorate, US Army CECOM RDEC, Fort Monmouth, NJ, USA
Volume :
1
fYear :
1995
fDate :
7-10 Nov 1995
Firstpage :
187
Abstract :
An analysis of the normal acceleration sensitivity of rotated Y-cut quartz SAW (Surface Acoustic Wave) and STW (Surface Transverse Wave) resonators simply supported along rectangular edges is presented. The analysis is based upon the perturbation integral formulation of Tiersten (1978), and makes use of the previously known analytic representation of the substrate deformation for the case considered. An approximate acoustic mode shape which accounts for spatial variations along all three axes is employed in the perturbation integral, allowing the derivation of analytic expressions relating the normal acceleration sensitivity to such parameters as substrate length, width, thickness, and orientation, mode center offset, mode shape spatial variations, etc. While the case considered represents something of an overestimate as compared to support configurations typically employed in production, questions regarding aspect-ratio compensation, optimum choice of substrate parameters, etc. are clarified by the case considered. The results of the analysis compare favorably with measurements of oscillators employing two-port SAW and STW resonators
Keywords :
acceleration; deformation; integral equations; quartz; sensitivity analysis; surface acoustic wave resonators; SAW resonators; STW resonators; SiO2; acceleration sensitivity; approximate acoustic mode shape; aspect-ratio compensation; perturbation integral formulation; rotated Y-cut quartz; substrate deformation; substrate parameters; surface acoustic wave resonators; surface transverse wave resonators; two-port resonators; Acceleration; Electronic warfare; Frequency; Integral equations; Oscillators; Performance analysis; Production; Shape; Surface acoustic waves; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE
Conference_Location :
Seattle, WA
ISSN :
1051-0117
Print_ISBN :
0-7803-2940-6
Type :
conf
DOI :
10.1109/ULTSYM.1995.495566
Filename :
495566
Link To Document :
بازگشت