DocumentCode :
2967642
Title :
High dynamic range background light suppression for a TOF distance measurement sensor in 180nm CMOS
Author :
Davidovic, Milos ; Hofbauer, Michael ; Schneider-Hornstein, Kerstin ; Zimmermann, Horst
Author_Institution :
Inst. of Electrodynamics, Microwave & Circuit Eng., Vienna Univ. of Technol., Vienna, Austria
fYear :
2011
fDate :
28-31 Oct. 2011
Firstpage :
359
Lastpage :
362
Abstract :
In this paper an integrated background light (BGL) immune single-pixel range finding sensor based on the time-of-flight (TOF) principle is presented. The sensor is fabricated in a standard 180 nm 1P6M CMOS process, reaching 40 × 40 μm2 total pixel area, at a fill factor of ~ 67%. As a key element for the BGL suppression a current-sample-and-hold circuit is introduced. A resulting distance variation as a function of BGL remained in a 1.5 cm range for applied dc light of 180 klx, which is, to our best knowledge, the highest BGL immunity reported so far. Measurement results are carried out at 100 fps, showing a standard deviation of 8 mm at 1 m and ~ 4 cm for distances up to 3.2 m.
Keywords :
CMOS integrated circuits; detector circuits; distance measurement; optical sensors; sample and hold circuits; sensors; BGL immunity; CMOS; TOF distance measurement sensor; high dynamic range background light suppression; immune single pixel range finding sensor; integrated background light; size 180 nm; time-of-flight principle; CMOS integrated circuits; CMOS process; Capacitors; Lighting; Optical sensors; Photodiodes; Semiconductor device measurement; 3D camera; Depth sensor; background light suppression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2011 IEEE
Conference_Location :
Limerick
ISSN :
1930-0395
Print_ISBN :
978-1-4244-9290-9
Type :
conf
DOI :
10.1109/ICSENS.2011.6127060
Filename :
6127060
Link To Document :
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