Title :
Self-exciting and self-sensing resonant cantilever sensors for improved monitoring of airborne nanoparticles exposure
Author :
Wasisto, H.S. ; Doering, L. ; Merzsch, S. ; Waag, A. ; Uhde, E. ; Peiner, E.
Author_Institution :
Inst. of Semicond. Technol. (IHT), Tech. Univ. of Braunschweig, Braunschweig, Germany
Abstract :
Self-exciting and self-sensing resonant cantilever sensors for airborne nanoparticles (NPs) monitoring are investigated. A fabricated self-sensing piezoresistive cantilever sensor is actuated using a piezo stack and operated in the second resonant mode. It is able to detect a resonant frequency shift of 33.58 Hz that corresponds to an airborne carbon NPs mass of 1.03 ng deposited during a 15-min sampling. The quality factor is 2100 resulting in a mass resolution of the sensor of 9.8 pg. In order to realize a portable airborne NPs monitoring device, thermally excited silicon cantilevers vibrating in different modes are proposed. The integration designs of heating resistors, sensing piezoresistors and electrostatic NPs sampling are further analyzed using finite-element modeling (FEM). An electrode for electrostatic NPs sampling is placed on the free-end of the cantilever. The results indicate that a self-sensing silicon electrothermal cantilever can fulfill the requirements of portable monitoring of airborne NPs exposure.
Keywords :
Q-factor; cantilevers; elemental semiconductors; finite element analysis; nanoparticles; nanosensors; piezoresistive devices; resistors; silicon; FEM; airborne carbon nanoparticles; airborne nanoparticle exposure monitoring; electrostatic nanoparticle sampling; finite element modeling; mass resolution; piezoresistors; piezostack actuation; portable airborne nanoparticle monitoring device; quality factor; resonant frequency shift; self-exciting resonant cantilever sensor; self-sensing piezoresistive cantilever sensor fabrication; self-sensing resonant cantilever sensor; self-sensing silicon electrothermal cantilever; thermally excited silicon cantilever; Carbon; Chemical sensors; Heating; Monitoring; Sensor phenomena and characterization; Silicon;
Conference_Titel :
Sensors, 2011 IEEE
Conference_Location :
Limerick
Print_ISBN :
978-1-4244-9290-9
DOI :
10.1109/ICSENS.2011.6127061