DocumentCode :
296777
Title :
SAW devices on diamond
Author :
Nakahata, H. ; Higaki, K. ; Fujii, S. ; Hachigo, A. ; Kitabayashi, H. ; Tanabe, K. ; Seki, Y. ; Shikata, S.
Author_Institution :
Itami Res. Labs., Sumitomo Electr. Ind. Ltd., Hyogo, Japan
Volume :
1
fYear :
1995
fDate :
7-10 Nov 1995
Firstpage :
361
Abstract :
SAW characteristics in a ZnO/diamond/Si structure were investigated by theoretical calculations and experiments using poly-crystalline diamond films. It was found that the 1st mode in the ZnO/IDT/diamond/Si structure has the velocity of 10,500 m/s and K2 value of 1.5%, and the 2nd mode in the IDT/ZnO/diamond/Si structure has the velocity of 11,600 m/s and K2 value of 1.1%. The experimental results agreed well with the calculated data. Utilizing this high velocity, a 2.5 GHz filter was fabricated with 1 μm line-and-space IDTs with the ZnO/IDT/diamond/Si structure. Propagation loss was confirmed to be much lower than ever reported for a ZnO/glass structure. It was also found by calculations that a SiO2 /ZnO/diamond/Si structure realizes a zero TCD value with the velocity of 10,700 m/s and the K2 value of 0.78% and that a LiNbO3/diamond/Si structure has a high velocity of 12,000 m/s and a large K2 value of 9%. These structures including a diamond layer can be effectively used for a variety of applications in GHz range with much higher velocities than those of conventional SAW materials such as LiTaO3, LiNbO3 or quartz
Keywords :
acoustic materials; diamond; surface acoustic wave filters; 2.5 GHz; SAW device; ZnO-C-Si; ZnO/diamond/Si structure; electromechanical coupling coefficient; filter; line-and-space IDT; phase velocity; polycrystalline diamond film; propagation loss; temperature coefficient of delay; Electrodes; Laboratories; Piezoelectric films; Piezoelectric materials; SAW filters; Semiconductor films; Substrates; Surface acoustic wave devices; Surface acoustic waves; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE
Conference_Location :
Seattle, WA
ISSN :
1051-0117
Print_ISBN :
0-7803-2940-6
Type :
conf
DOI :
10.1109/ULTSYM.1995.495599
Filename :
495599
Link To Document :
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