DocumentCode
2967832
Title
Interactive SIMD ray tracing for large deformable tetrahedral meshes
Author
Gross, Markus ; Hagen, Hans ; Pfreund, F.-J.
Author_Institution
Int. Res. & Training Group, Fraunhofer ITWM, Kaiserslautern
fYear
2008
fDate
9-10 Aug. 2008
Firstpage
147
Lastpage
154
Abstract
We introduce an interactive ray tracing method for large deformable tetrahedral meshes which has carefully been designed for supporting general single instruction multiple data (SIMD) operations. It uses memory aligned and SIMD-friendly hierarchical acceleration structures and tetrahedron acceleration data allowing SIMD ray traversal and a newly proposed SIMD barycentric tetrahedron-plane intersection test. The method is very general and allows volume-, opaque- and accelerated (semi) iso surface-rendering as well as visualizing multidimensional data. It scales for static data sets sublinear to data size, such that it is well suited for visualizing massive data sets. The method is also very portable and not restricted to specialized hardware, such that it natively supports near future hardware which will be many core architectures supporting up to 512-bit register operations, allowing for each core to trace up to 16 rays at once through the mesh.
Keywords
computational geometry; data visualisation; interactive systems; mesh generation; parallel architectures; ray tracing; rendering (computer graphics); surface fitting; tree data structures; SIMD barycentric tetrahedron-plane intersection test; SIMD-friendly hierarchical acceleration structure; interactive SIMD ray tracing; large deformable tetrahedral mesh; massive data set visualization; multidimensional data visualization; single instruction multiple data operation; skd-tree construction; surface-rendering; Acceleration; Computational fluid dynamics; Computer architecture; Computer graphics; Data visualization; Hardware; Life estimation; Multidimensional systems; Ray tracing; Testing; I.3.7 [Computer Graphics]: Three-Dimensional Graphics and Realism—Raytracing;
fLanguage
English
Publisher
ieee
Conference_Titel
Interactive Ray Tracing, 2008. RT 2008. IEEE Symposium on
Conference_Location
Los Angeles, CA
Print_ISBN
978-1-4244-2741-3
Type
conf
DOI
10.1109/RT.2008.4634635
Filename
4634635
Link To Document