Title :
Dedicated finite elements for electrode thin films on quartz resonators
Author :
Srivastava, Sonal A. ; Yong, Yook-Kong ; Tanaka, Masako ; Imai, Tsutomu
Author_Institution :
Dept of Civil Eng., Rutgers Univ., New Brunswick, NJ, USA
Abstract :
The finite element meshes of thickness shear piezoelectric resonators must be sufficiently fine so that the mesh impedance (stiffness) itself does not interfere with the acoustic wave propagation. Since the thickness of the thin electrode film is usually much less than the resonator plate itself, the mesh for the electrodes is usually not optimal, and would usually have a poor aspect ratio, that is, the element length or width is more than twice the element thickness. Special elements for the thin electrode film are proposed, and their results are compared with accurate numerical results. Finite element models are used to demonstrate the effects of electrode boundary conditions and thickness of electrodes on the frequency-temperature curves of an AT cut plate. Results are also shown to demonstrate the efficiency of reducing the electrode to the interface of the crystal and electrode using acceptable approximations such as Guyan reduction and merging.
Keywords :
acoustic wave propagation; crystal resonators; electrodes; finite element analysis; metallic thin films; Guyan reduction; acoustic wave propagation; dedicated finite elements; electrode boundary conditions; electrode thickness; electrode thin films; finite element meshes; merging; mesh impedance; quartz resonators; thickness shear piezoelectric resonators; Acoustic propagation; Acoustic waves; Boundary conditions; Electrodes; Finite element methods; Frequency; Impedance; Merging; Piezoelectric films; Transistors;
Conference_Titel :
Ultrasonics Symposium, 2004 IEEE
Print_ISBN :
0-7803-8412-1
DOI :
10.1109/ULTSYM.2004.1417719