DocumentCode
2968078
Title
Investigation of the pseudospark produced intense electron beam
Author
Lebedev, S.V. ; Machida, M. ; Moshkalyov, S.A. ; Campos, D.O.
Author_Institution
Inst. de Fisica Gleb Wataghin, Univ. Estadual de Campinas, Sao Paulo, Brazil
fYear
1996
fDate
3-5 June 1996
Firstpage
130
Lastpage
131
Abstract
Summary from only given, as follows. In recent years pseudospark discharges has been given a considerable attention as a source of intense pulsed electron beam. The beam parameters (peak current up to a few kA, pulse duration /spl sim/50 ns, beam diameter 1-3 mm, power density /spl sim/10/sup 8/ W/cm/sup 2/) makes it attractive for application in diverse areas, such as material processing, as a point source of soft X-ray, etc. The results of an experimental study of the pseudospark produced electron beam propagation to the target will be presented. The pseudospark chamber consists of a modular ten-gap electrodes and insulator discs stacked between anode and hollow cathode. The anode and electrodes have a 2 mm central hole for discharge formation and beam extraction. Breakdown voltage is about 30 kV, storage capacitance varied in the range from 100 pF to 3000 pF and a free-running (/spl sim/100 Hz) or triggered mode is used. The electron beam generated in the discharge propagates through the gas (Ar, He, N/sub 2/) to the target situated at the Faraday cup. An efficiency of the beam transportation through the drift region is determined by the neutralization of the space-charge of the beam and, as it has been shown, by the geometry of the return current circuit. An influence of the drift region geometry and the gas pressure on the stability of the beam propagation will be discussed. Time-resolved measurements of the beam current distribution for different configurations of the drift region will be reported.
Keywords
sparks; 100 to 3000 pF; 30 kV; Faraday cup; beam current distribution; beam parameters; beam propagation stability; beam transportation; electron beam; electron beam propagation; gas pressure; hollow cathode; intense electron beam; material processing; modular ten-gap electrodes; point source; power density; pseudospark discharge; soft X-ray; time-resolved measurements; Anodes; Argon; Capacitance; Cathodes; Electrodes; Electron beams; Fault location; Geometry; Insulation; Materials processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1996. IEEE Conference Record - Abstracts., 1996 IEEE International Conference on
Conference_Location
Boston, MA, USA
ISSN
0730-9244
Print_ISBN
0-7803-3322-5
Type
conf
DOI
10.1109/PLASMA.1996.550622
Filename
550622
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