• DocumentCode
    2968141
  • Title

    Static and dynamic testing of power MOSFETs

  • Author

    Galyon, G.T. ; Cardinal, J. ; Singh, PJ ; Newcomer, J. ; Lorenz, W. ; Chu, K.

  • Author_Institution
    Server Group, IBM Corp., Poughkeepsie, NY, USA
  • Volume
    1
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    230
  • Abstract
    Laboratory efforts to duplicate power MOSFET service failures in a controlled, short term laboratory experiment have largely been without success. Experimentation in this laboratory have established tests, both static and dynamic, that reproduce long term service type failures in a short term test. This paper describes these test results and comments on the resultant reliability improvements
  • Keywords
    dynamic testing; power MOSFET; semiconductor device reliability; semiconductor device testing; dynamic short circuit testing; dynamic testing; long term service type failures; power MOSFET; reliability improvements; reverse recovery testing; short term test; static reverse bias testing; static testing; Circuit breakers; Circuit testing; Clamps; Failure analysis; Laboratories; MOSFETs; Packaging; Power systems; Pulse width modulation converters; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 2001. APEC 2001. Sixteenth Annual IEEE
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-6618-2
  • Type

    conf

  • DOI
    10.1109/APEC.2001.911653
  • Filename
    911653
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2968141