• DocumentCode
    296821
  • Title

    Some new results on the ultrasonic behavior of SrTiO3 in the quantum paraelectric region

  • Author

    Balashova, E.V. ; Lemanov, V.V. ; Kunze, R. ; Martin, G. ; Weihnacht, M.

  • Author_Institution
    A.F. Ioffe Physicotech. Inst., Acad. of Sci., St. Petersburg, Russia
  • Volume
    1
  • fYear
    1995
  • fDate
    7-10 Nov 1995
  • Firstpage
    653
  • Abstract
    Results on the ultrasonic study of SrTiO3 in the temperature range from 20 to 120 K using an electrostrictive interdigital transducer for longitudinal waves and piezoelectric transducer for shear waves are presented. A thermally activated relaxation loss mechanism due to strain-induced domain wall motion has been observed in the tetragonal phase of SrTiO3. Below 40 K the anomalies in velocity and attenuation indicating the possible onset of Muller state have been found for both longitudinal and shear waves. The decrease of velocity has been connected with anomalous temperature behavior of elastic constant c44, and peaks of attenuation could be explained by fluctuations
  • Keywords
    dielectric losses; dielectric relaxation; elastic constants; electric domain walls; ferroelectric materials; fluctuations; strontium compounds; ultrasonic absorption; ultrasonic velocity; 20 to 120 K; Muller state; SrTiO3; anomalies; anomalous temperature behavior; attenuation; elastic constant; electrostrictive interdigital transducer; fluctuations; longitudinal wave; longitudinal waves; piezoelectric transducer; quantum paraelectric region; shear wave; shear waves; strain-induced domain wall motion; tetragonal phase; thermally activated relaxation loss mechanism; ultrasonic behavior; ultrasonic study; velocity; Acoustic transducers; Acoustic waves; Attenuation measurement; Electrostriction; Frequency; Phase measurement; Surface acoustic waves; Temperature dependence; Ultrasonic transducers; Ultrasonic variables measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-2940-6
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1995.495657
  • Filename
    495657