Spectral correlation filters for flaw detection

Author

Donohue, K.D. ; Cheah, H.Y.

Author_Institution

Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA

Volume

1

fYear

1995

fDate

7-10 Nov 1995

Firstpage

725

Abstract

A filtering approach is presented that exploits structural differences between the grain and flaw echo through spectral correlation. Analytical and simulation results demonstrate that back-scattered energy from many randomly distributed scatterers within a resolution cell results in no spectral correlation, while back-scattered energy from resolution cells with only a few scatterers exhibits significant spectral correlation. Performance differences between simple spectral correlation filters and conventional spectral filters are discussed for simple and complex (more than one effective scattering center) defects

Keywords

acoustic correlation; acoustic filters; backscatter; echo; flaw detection; spectral analysis; ultrasonic materials testing; ultrasonic scattering; analytical results; back-scattered energy; complex defects; flaw detection; flaw echo; grain; randomly distributed scatterers; resolution cell; simple defects; simulation results; spectral correlation filters; structural differences; ultrasonic application; Acoustic applications; Analytical models; Autocorrelation; Echo interference; Energy resolution; Filtering; Matched filters; Scattering; Speckle; Wiener filter;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE

Conference_Location

Seattle, WA

ISSN

1051-0117

Print_ISBN

0-7803-2940-6

Type

conf

DOI

10.1109/ULTSYM.1995.495671

Filename

495671