DocumentCode :
2968313
Title :
Barrier-layer, multilayer-ceramic capacitor processing: effects of termination and plating process parameters
Author :
Anderson, F.R. ; Haynes, Richard ; Pinault, Steven C.
Author_Institution :
AT&T Bell Lab., Princeton, NJ, USA
fYear :
1989
fDate :
22-24 May 1989
Firstpage :
765
Lastpage :
768
Abstract :
Studies of the effects of termination and plating process parameters on the fabrication of multilayer ceramic capacitors intended for use as surface-mount devices are discussed. Electrical properties such as capacitance, dissipation factor, and insulation resistance are sensitive to plating process parameters used to deposit a nickel barrier layer and a tin/lead solder layer. The parameters in this study included: (1) three capacitor lots; (2) eight termination ink types; (3) seven termination bandwidths; (4) two termination crown heights; (5) the number of coulombs used for nickel plating; and (6) the time and current density for solder plating. Fifty experiments were performed, nine of which were replications to estimate experimental error. As responses, 1830 data points each were measured for the capacitance, dissipation factor (DF), and internal resistance. Four of the inks could be ranked as statistically superior. Termination crown height and bandwidth and solder plating had a significant effect, whereas nickel plating had no effect. Lot variability had a marginal effect on DF and DF spread
Keywords :
capacitors; ceramics; electron device manufacture; electroplating; statistical analysis; surface mount technology; MLC type; Ni barrier layer; SMD; SnPb solder layer; capacitance; current density; dissipation factor; electrical properties; experimental error; fabrication; insulation resistance; internal resistance; multilayer-ceramic capacitor processing; plating process parameters; surface-mount devices; termination bandwidths; termination crown heights; termination effects; termination ink; Bandwidth; Capacitance; Capacitors; Ceramics; Dielectrics and electrical insulation; Fabrication; Ink; Nickel; Nonhomogeneous media; Surface resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components Conference, 1989. Proceedings., 39th
Conference_Location :
Houston, TX
Type :
conf
DOI :
10.1109/ECC.1989.77837
Filename :
77837
Link To Document :
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