DocumentCode :
2968370
Title :
Emission and postemission of charged particles in vacuum at low values of an external electric field
Author :
Tatarinova, N.V.
Author_Institution :
Nat. Res. Nucl. Univ. MEPhI, Moscow, Russia
fYear :
2012
fDate :
2-7 Sept. 2012
Firstpage :
26
Lastpage :
28
Abstract :
It is known, that the presence of oxide films and nonmetallic inclusions on a high-voltage electrode surface considerably reduce a vacuum gap electric strength. One of this phenomenon causes is electric charge occurrence in them, which one increases an external electric field strength. The charged particles postemission existence after external voltage switching-off is explained by such charge influence. In this report the experiment data, in which one the increase of an electric charge on an electrode surface after external voltage switching-off was watched, are represented. It is demonstrated, that at low external field strength it is impossible to explain this phenomenon by a field emission processes. Prebreakdown currents appearance and behavior of a charge in nonmetallic films mechanisms are considered by processes in pores or pore typed defects, i.e. by poroemission processes.
Keywords :
electric breakdown; electric charge; electric fields; electrodes; field emission; inclusions; vacuum insulation; charged particle post-emission process; electric charge; external electric field; external electric field strength; external voltage switching-off; field emission process; high-voltage electrode surface; nonmetallic film mechanisms; nonmetallic inclusions; oxide films; pore typed defects; prebreakdown current appearance; vacuum electrical insulation strength; vacuum gap electric strength; Cathodes; Discharges (electric); Films; Insulation; Ions; Partial discharges;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Discharges and Electrical Insulation in Vacuum (ISDEIV), 2012 25th International Symposium on
Conference_Location :
Tomsk
ISSN :
1093-2941
Print_ISBN :
978-1-4673-1263-9
Electronic_ISBN :
1093-2941
Type :
conf
DOI :
10.1109/DEIV.2012.6412441
Filename :
6412441
Link To Document :
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