DocumentCode :
296838
Title :
Lamb wave tomography and its application in pipe erosion/corrosion monitoring
Author :
Pei, J. ; Yousuf, M.I. ; Degertekin, F.L. ; Honein, B.V. ; Khuri-Yakub, B.T.
Author_Institution :
Edward L. Ginzton Lab., Stanford Univ., CA, USA
Volume :
1
fYear :
1995
fDate :
7-10 Nov 1995
Firstpage :
795
Abstract :
Ultrasonic Lamb wave techniques are widely used in a number of NDE applications. To excite Lamb waves, mode conversion of bulk waves or photo acoustic excitation are often used. Both of these approaches suffer from the need for liquid couplant or ablation of materials to reach good signal to noise ratio. In this paper, we propose a novel technique that utilizes point source excitation and detection of Lamb waves through dry, elastic contacts to monitor velocity changes. We demonstrate the power of this approach in ultrasonic pipe erosion/corrosion monitoring and its potential application in aircraft skin defect imaging. We present results of measurements of plate thickness, and erosion/corrosion in a section of pipe that was removed from service, as well as imaging of defects in an aluminum thin plate
Keywords :
acoustic tomography; aircraft testing; corrosion testing; flaw detection; surface acoustic wave transducers; thickness measurement; ultrasonic imaging; ultrasonic materials testing; ultrasonic velocity measurement; wear testing; Al thin plate defects; Hertzian contact; Lamb wave detection; Lamb wave tomography; NDE; TOF measurement technique; aircraft skin defect imaging; dry elastic contacts; pipe erosion/corrosion monitoring; plate like structures; plate thickness; point source excitation; scan imaging system; signal to noise ratio; ultrasonic Lamb wave techniques; velocity change monitoring; zeroth order antisymmetric Lamb wave; Acoustic signal detection; Acoustic waves; Aircraft; Corrosion; Monitoring; Signal to noise ratio; Skin; Thickness measurement; Tomography; Ultrasonic imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE
Conference_Location :
Seattle, WA
ISSN :
1051-0117
Print_ISBN :
0-7803-2940-6
Type :
conf
DOI :
10.1109/ULTSYM.1995.495686
Filename :
495686
Link To Document :
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