• DocumentCode
    2968407
  • Title

    A new physics-based compact model for AlGaN/GaN HFETs

  • Author

    Yin, Hong ; Bilbro, G.L. ; Trew, R.J.

  • Author_Institution
    North Carolina State Univ., Raleigh
  • fYear
    2007
  • fDate
    3-8 June 2007
  • Firstpage
    787
  • Lastpage
    790
  • Abstract
    A physics-based analytic model with no fitting parameters is introduced for the AlGaN/GaN HFET. For unsaturated operation, non-linear analytic models for the I-V characteristics in the two access regions and beneath the gate are developed. The resulting equations are linked together by voltage and current continuity at the boundaries. Good agreement between the model and corresponding simulations with ATLAS, a commercial simulator, is demonstrated. In addition, the proposed model is shown to compare favorably with popular curve-fitting models of HFET operation.
  • Keywords
    aluminium compounds; curve fitting; gallium compounds; high electron mobility transistors; semiconductor device models; wide band gap semiconductors; ATLAS simulator; AlGaN; current continuity; curve-fitting; heterostructure field effect transistors; nonlinear analytic models; semiconductor device models; voltage continuity; Aluminum gallium nitride; Circuit simulation; Electrons; Gallium nitride; HEMTs; MODFETs; Physics; Polarization; Predictive models; Voltage; HEMT; modeling; resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 2007. IEEE/MTT-S International
  • Conference_Location
    Honolulu, HI
  • ISSN
    0149-645X
  • Print_ISBN
    1-4244-0688-9
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2007.380058
  • Filename
    4263937