DocumentCode :
2968407
Title :
A new physics-based compact model for AlGaN/GaN HFETs
Author :
Yin, Hong ; Bilbro, G.L. ; Trew, R.J.
Author_Institution :
North Carolina State Univ., Raleigh
fYear :
2007
fDate :
3-8 June 2007
Firstpage :
787
Lastpage :
790
Abstract :
A physics-based analytic model with no fitting parameters is introduced for the AlGaN/GaN HFET. For unsaturated operation, non-linear analytic models for the I-V characteristics in the two access regions and beneath the gate are developed. The resulting equations are linked together by voltage and current continuity at the boundaries. Good agreement between the model and corresponding simulations with ATLAS, a commercial simulator, is demonstrated. In addition, the proposed model is shown to compare favorably with popular curve-fitting models of HFET operation.
Keywords :
aluminium compounds; curve fitting; gallium compounds; high electron mobility transistors; semiconductor device models; wide band gap semiconductors; ATLAS simulator; AlGaN; current continuity; curve-fitting; heterostructure field effect transistors; nonlinear analytic models; semiconductor device models; voltage continuity; Aluminum gallium nitride; Circuit simulation; Electrons; Gallium nitride; HEMTs; MODFETs; Physics; Polarization; Predictive models; Voltage; HEMT; modeling; resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location :
Honolulu, HI
ISSN :
0149-645X
Print_ISBN :
1-4244-0688-9
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2007.380058
Filename :
4263937
Link To Document :
بازگشت