Multiple-fault diagnosis based on Binary Decision Diagram

In this paper, a method is described about multiple-fault diagnosis based on Binary Decision Diagram (BDD). This method can be applied to digital systems of which the fault mechanism can be expressed by fault trees with independent basic events. First, to assure the unique structure of the final integrated BDD, a new rule is added into the component connection method for fault tree conversion to BDD. Then through comparing the probabilities of cut sets with the same length of Huffman code, the ordering of checking the fault source is determined. Finally an example is given to explain this process. Because this method has no need to simplify the integrated BDD and determine the minimal cut sets (MCSs), it´s more suitable for computer execution and has higher efficiency than traditional methods of fault tree diagnosis.