• DocumentCode
    2968436
  • Title

    Quasi-optical waveguide W-band spectrometer for precision dielectric measurement of absorbing materials

  • Author

    Afsar, M.N. ; Tkachov, I.I. ; Kocharyan, K.N.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Tufts Univ., Medford, MA, USA
  • fYear
    1998
  • fDate
    6-10 July 1998
  • Firstpage
    530
  • Lastpage
    531
  • Abstract
    A quasi-optical waveguide bridge spectrometer is designed and constructed for the precision measurement of dielectric permittivity and loss tangent of medium and highly absorbing materials over an extended W-band frequency range. An electronically sweeping backward wave oscillator (BWO) is used as a source of tunable coherent radiation in the frequency range 70-118 GHz. The high output power of BWO (typically 50-100 mW at each frequency) and high sensitivity receiver system employing a liquid helium cooled InSb detector enable the accurate transmission measurement of highly absorbing materials. Data for very absorbing materials such as the low resistivity silicon and germanium are presented and compared.
  • Keywords
    backward wave oscillators; bridge instruments; dielectric loss measurement; electromagnetic wave transmission; elemental semiconductors; germanium; microwave measurement; microwave spectrometers; millimetre wave measurement; millimetre wave spectroscopy; permittivity measurement; silicon; waveguides; 70 to 118 GHz; Ge; Si; W-band spectrometer; accurate transmission measurement; dynamic range; electronically sweeping backward wave oscillator; extended W-band frequency range; high sensitivity receiver system; highly absorbing materials; liquid helium cooled InSb detector; loss tangent measurement; low resistivity germanium; low resistivity silicon; medium absorbing materials; permittivity measurement; precision dielectric measurement; quasi-optical waveguide bridge spectrometer; tunable coherent radiation source; Bridges; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Electrochemical impedance spectroscopy; Frequency measurement; Loss measurement; Oscillators; Permittivity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 1998 Conference on
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    0-7803-5018-9
  • Type

    conf

  • DOI
    10.1109/CPEM.1998.700040
  • Filename
    700040