DocumentCode :
2968978
Title :
Reliability figures of merit for surface-soldered leadless chip carriers compared to leaded packages
Author :
Clech, J.P. ; Englemaier, W. ; Kotlowitz, R.W. ; Augis, J.A.
Author_Institution :
AT&T Bell Lab., Whippany, NJ, USA
fYear :
1989
fDate :
22-24 May 1989
Firstpage :
781
Lastpage :
790
Abstract :
Figures of merit (FMs) for solder attachment reliability that account for the primary factors determining long-term interconnection integrity are discussed. The FMs provide relative measures of the reliability impact of a component or device/substrate assembly, and serve as a GO/NO-GO decision tool for package, physical, and circuit designers. The FMs are an integral part of the design-for-reliability process at key product development stages: component design and/or selection, component/substrate assembly design, and system design including thermal environment, product service life, and attachment-reliability target. The use of FMs for attachment-reliability evaluation is discussed through examples based on the solder-joint-fatigue performance of thermally cycled leaded and leadless surface mounted devices
Keywords :
circuit reliability; failure analysis; integrated circuit technology; integrated circuit testing; soldering; surface mount technology; GO/NO-GO decision tool; LCC; figures of merit; leaded packages; leadless chip carriers; long-term interconnection integrity; package; solder attachment reliability; solder-joint-fatigue performance; surface mounted devices; thermally cycled devices; Assembly systems; Fatigue; Flexible manufacturing systems; Lead; Life estimation; Magneto electrical resistivity imaging technique; Packaging; Process design; Samarium; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components Conference, 1989. Proceedings., 39th
Conference_Location :
Houston, TX
Type :
conf
DOI :
10.1109/ECC.1989.77840
Filename :
77840
Link To Document :
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