DocumentCode :
2969239
Title :
Electrical measurement of modified sol-gel derived lead titanate thin films capacitor
Author :
Nurbaya, Z. ; Habibah, Z. ; Rusop, M.
Author_Institution :
Fac. of Electr. Eng., Nano-Electron. Center (NET), Univ. Teknol. MARA (UiTM), Shah Alam, Malaysia
fYear :
2013
fDate :
25-27 Nov. 2013
Firstpage :
1
Lastpage :
3
Abstract :
The thin films of lead titanate (PbTiO3) have been prepared on ITO coated glass substrate by means of storage element for DC power application. The solution was prepared by modified sol-gel process that involved sonication process to ensure the uniform nanoparticulates formation before ageing stage take parts. In the need to compensate the lead loss, extra 10mol% of Pb content was added to the solution. The thin films were deposited at high spin speed around 3500 rpm at 30 seconds with multiple coating processes. Microstructural observation was done through scanning electron microscopy that shows the existence of zero layers between PbTiO3 and ITO electrode and the film thickness was about ~420nm. Besides that, electrical properties of PbTiO3 thin films were measured by using impedance spectroscope analyzer and 2-points probe solar simulator for dielectric and i-v characteristic respectively. It was found that the dielectric constant value achieved 153 at 1000 Hz plus with approachable of 0.723 energy loss. It is certainly noticed that the thin films was in ohmic behavior where the current density was about 10-9A/cm2.
Keywords :
electrochemical impedance spectroscopy; indium compounds; lead compounds; nanoparticles; scanning electron microscopy; sol-gel processing; thin film capacitors; tin compounds; titanium compounds; 2-points probe solar simulator; DC power application; ITO; ITO coated glass substrate; PbTiO3; ageing stage; impedance spectroscope analyzer; lead titanate; microstructural observation; modified sol-gel process; scanning electron microscopy; sonication process; storage element; thin films capacitor; uniform nanoparticulates formation; zero layers; Capacitors; Dielectric measurement; Films; Glass; Indium tin oxide; Lead; I-V measurement; Lead titanate thin films; dielectric measurement; extra Pb content surface morphology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Smart Instrumentation, Measurement and Applications (ICSIMA), 2013 IEEE International Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4799-0842-4
Type :
conf
DOI :
10.1109/ICSIMA.2013.6717941
Filename :
6717941
Link To Document :
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