• DocumentCode
    296936
  • Title

    Multi-wavelength imaging pyrometer for noncontact temperature sensing

  • Author

    Kaplinsky, Michael B. ; Kosonocky, Walter F. ; McCaffrey, Nathaniel J. ; Li, Jun ; Hou, Edwin S H ; Manikopoulos, Constantine N. ; Ravindra, N.M.

  • Author_Institution
    Electronic Imaging Center, New Jersey Inst. of Technol., Newark, NJ, USA
  • Volume
    1
  • fYear
    34881
  • fDate
    10-14 Jul1995
  • Firstpage
    199
  • Abstract
    Multi-wavelength imaging pyrometer (M-WIP) is presented for remote sensing of temperature profiles of targets with unknown emissivity. A software package was developed for calibration and real-time M-WIP measurements. An experimental 7-filter line-sensing M-WIP system was implemented with a 320×122-element PtSi IR-CCD imager. The M-WIP system was calibrated against a commercial blackbody source over a temperature range from 450°C to 900°C. The signal processing included background subtraction and compensation for variation of dark current with detected signal and nonlinearity of IR imager response. Initial M-WIP measurements demonstrated real-time temperature resolution ΔT of ±1°C for blackbody target over temperature range from 600°C to 900°C
  • Keywords
    CCD image sensors; calibration; infrared imaging; pyrometers; remote sensing; spectral methods of temperature measurement; 450 to 900 C; 7-filter line-sensing M-WIP system; IR imager response nonlinearity; PtSi; PtSi IR-CCD imager; background subtraction; blackbody source; blackbody target; calibration; dark current compensation; multi-wavelength imaging pyrometer; noncontact temperature sensing; radiometric model; real-time temperature resolution; remote sensing; signal processing; software package; Calibration; Dark current; Infrared detectors; Remote sensing; Signal processing; Software measurement; Software packages; Temperature distribution; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 1995. ISIE '95., Proceedings of the IEEE International Symposium on
  • Conference_Location
    Athens
  • Print_ISBN
    0-7803-7369-3
  • Type

    conf

  • DOI
    10.1109/ISIE.1995.496626
  • Filename
    496626