Title :
2007 International conference on design & technology of integrated systems in nanoscale era
Abstract :
The following topics are dealt with: IC reliability; low-power electronics; wireless systems; VLSI testing; DFT; CMOS design; IC simulation; circuit validation; FPGA; analog design; RFIC design; PLL design; signal integrity and DSM effects.
Keywords :
CMOS integrated circuits; analogue integrated circuits; field programmable gate arrays; integrated circuit design; integrated circuit reliability; low-power electronics; phase locked loops; radiofrequency integrated circuits; CMOS design; DFT; DSM effects; FPGA; IC reliability; RFIC design; VLSI testing; analog design; circuit validation; low-power electronics; signal integrity; wireless systems;
Conference_Titel :
Design & Technology of Integrated Systems in Nanoscale Era, 2007. DTIS. International Conference on
Conference_Location :
Rabat
Print_ISBN :
978-1-4244-1277-8
DOI :
10.1109/DTIS.2007.4449473
