Title :
A low-cost fault tolerant solution targeting to commercial FPGA devices
Author :
Siozios, Kostas ; Soudris, Dimitrios
Author_Institution :
Sch. of Electr. & Comput. Eng., Nat. Tech. Univ. of Athens, Athens, Greece
Abstract :
Technology scaling in conjunction to the trend towards higher performance introduce an increased number of upsets due to reliability degradation. This problem becomes an important design concern, not only for safety critical systems, but almost for the majority of architectures. At this paper, a novel software-supported framework targeting to provide sufficient fault masking at SRAM-based FPGAs against to reliability degradation, without the excessive mitigation cost of similar approaches, is introduced. Experimental results with a number of industrial oriented DSP kernels prove the effectiveness of our solution, since we achieve considerable delay and power improvements for comparable fault masking.
Keywords :
SRAM chips; digital signal processing chips; fault tolerance; field programmable gate arrays; safety-critical software; SRAM-based FPGA; commercial FPGA devices; fault masking; industrial oriented DSP kernels; low-cost fault tolerant solution; safety critical systems; software-supported framework; technology scaling; Degradation; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Routing; Tunneling magnetoresistance;
Conference_Titel :
Adaptive Hardware and Systems (AHS), 2012 NASA/ESA Conference on
Conference_Location :
Erlangen
Print_ISBN :
978-1-4673-1915-7
Electronic_ISBN :
978-1-4673-1914-0
DOI :
10.1109/AHS.2012.6268668