Title :
A 3D SoC design for H.264 application with on-chip DRAM stacking
Author :
Zhang, Tao ; Wang, Kui ; Feng, Yi ; Chen, Yan ; Li, Qun ; Shao, Bing ; Xie, Jing ; Song, Xiaodi ; Duan, Lian ; Xie, Yuan ; Cheng, Xu ; Lin, Youn-Long
Author_Institution :
Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA, USA
Abstract :
Three-dimensional (3D) on-chip memory stacking has been proposed as a promising solution to the “memory wall” challenge with the benefits of low access latency, high data bandwidth, and low power consumption. The stacked memory tiers leverage through-silicon-vias (TSVs) to communicate with logic tiers, and thus dramatically reduce the access latency and improve the data bandwidth without the constraint of I/O pin count. To demonstrate the feasibility of 3D memory stacking, this paper introduces a 3D System-on-Chip (SoC) for H.264 applications that can make use of multiple memory channels offered by 3D integration. Two logic tiers are stacked together with each having an area of 2.5×5.0mm2, with a 3-layer 8-channel 3D DRAM stacked on the top. The design flow for this 3D SoC is also presented. The prototype chip has been fabricated with GlobalFoundries´ 130nm low-power process and Tezzaron´s 3D TSV technology. The 3D implementation shows that the 3D ICs can alleviate the pressure from I/O pin count and allow parallel memory accesses through multiple channels.
Keywords :
DRAM chips; integrated circuit design; logic design; system-on-chip; three-dimensional integrated circuits; video coding; 3D IC; 3D SoC design; 3D TSV technology; 3D integration; 3D memory stacking; 3D system-on-chip; H.264 application; I/O pin count; access latency; data bandwidth; design flow; logic tier; low power consumption; memory channel; memory wall; on-chip DRAM stacking; parallel memory access; size 130 nm; three-dimensional on-chip memory stacking; through-silicon-vias; Bandwidth; Bonding; Random access memory; Stacking; System-on-a-chip; Three dimensional displays; Through-silicon vias;
Conference_Titel :
3D Systems Integration Conference (3DIC), 2010 IEEE International
Conference_Location :
Munich
Print_ISBN :
978-1-4577-0526-7
DOI :
10.1109/3DIC.2010.5751446