• DocumentCode
    2970300
  • Title

    Multi-frequency ultrasonic NDE for early defect recognition and imaging

  • Author

    Pfleiderer, K. ; Aufrecht, J. ; Solodov, I. ; Busse, G.

  • Author_Institution
    Dept. of Non-Destructive Testing, Stuttgart Univ., Germany
  • Volume
    1
  • fYear
    2004
  • fDate
    23-27 Aug. 2004
  • Firstpage
    693
  • Abstract
    The nonlinear response of flaws results in frequency changes which can be used for NDE (nondestructive evaluation). We report on the observation and NDE application of the ultimate nonlinear spectrum which (beyond the well-known ultra-harmonics and modulation side-bands) comprises sub-harmonics, ultra-subharmonics and ultra-frequency pairs. The experiments include 20-40 kHz intense acoustic wave excitation and local spectrum measurements with a scanning laser interferometer over the 1 MHz frequency range. The new modes produced reveal the distinctive features of the nonlinear resonance mechanism: hysteresis, bistability and avalanche-like dynamics. Unlike that of the excitation frequency, their spatial distribution is confined strictly around the sources of nonlinearity (defects) and is used for the multi-frequency C-scan imaging of flaws that are invisible in the mono-frequency NDE regime. The series of images for various frequency lines is applied to remove background noise and to enhance the object to be identified by linear and nonlinear image processing. The results obtained for the fractured defects (impacts, cracks, delaminations, welded-joints) in a number of materials (CFRP, C-C/SiC, etc.) and components demonstrate evident benefits of the cumulative multi-frequency NDE for defect recognition and imaging.
  • Keywords
    flaw detection; harmonics; image enhancement; light interferometers; measurement by laser beam; object recognition; ultrasonic imaging; ultrasonic materials testing; 1 MHz; 20 to 40 kHz; defect imaging; defect recognition; flaws; fracture defects; image enhancement; intense acoustic wave excitation; linear image processing; modulation side-bands; multi-frequency ultrasonic nondestructive evaluation; nonlinear image processing; nonlinear response; nonlinear spectrum; object identification; scanning laser interferometer; ultra-frequency pairs; ultra-harmonics; ultra-subharmonics; Acoustic measurements; Acoustic waves; Background noise; Frequency measurement; Hysteresis; Image recognition; Laser excitation; Laser modes; Resonance; Ultrasonic imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2004 IEEE
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-8412-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2004.1417816
  • Filename
    1417816