• DocumentCode
    2970571
  • Title

    Decoder-based Decompression for test sets containing don’t cares

  • Author

    Voyiatzis, I. ; Antonopoulou, H.

  • Author_Institution
    Educational Inst. of Athens, Athens
  • fYear
    2007
  • fDate
    2-5 Sept. 2007
  • Firstpage
    229
  • Lastpage
    232
  • Abstract
    A novel scheme for decompressing test sets containing don´t care values is presented. Compared to traditional scan-based schemes, the proposed schemes provides for lower test application time, lower hardware overhead and lower power consumption during the application of the test set.
  • Keywords
    automatic test pattern generation; data compression; decoding; low-power electronics; decoder-based decompression; test sets decompression; Application software; Circuit testing; Decoding; Educational technology; Energy consumption; Hardware; Informatics; Latches; Power engineering computing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Technology of Integrated Systems in Nanoscale Era, 2007. DTIS. International Conference on
  • Conference_Location
    Rabat
  • Print_ISBN
    978-1-4244-1277-8
  • Electronic_ISBN
    978-1-4244-1278-5
  • Type

    conf

  • DOI
    10.1109/DTIS.2007.4449526
  • Filename
    4449526
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2970571